MEMORY TESTING MECHANISM: AN EAGLE EYE

Prof. Sanjay Malani; Prof. Rounak Gupta; Dr. Sagar Tawani

doi:10.17605/OSF.IO/RZXPU

Authors

Prof. Sanjay Malani Assistant Professor, Department of Mechanical Engineering, Sipna College of Engineering and Technology, Maharashtra, India
Prof. Rounak Gupta Assistant Professor, Department of Electronics and Telecommunication Engineering, Sipna College of Engineering and Technology, Maharashtra, India
Dr. Sagar Tawani Assistant Professor, Department of Electronics and Telecommunication Engineering, Sipna College of Engineering and Technology, Maharashtra, India

DOI:

https://doi.org/10.17605/OSF.IO/RZXPU

Keywords:

Memory Testing, MBIST, BIST

Abstract

In order to fulfill the market need almost everyday novel products are through of and are developed using top-notched technology. The first and the foremost expectation from such products is, they are expected to be super quick. To make any product super responsive, the processing capacity and the storage component play equal and vital role. Apart from this, self-diagnosis has gaining significant place in the development of the smart products. The product capable of self-testing, reduces time to market, increases the live time and also prevent the possible data loss in case if failure occurs. Different testing mechanisms are employed to implement self-diagnosing procedures in the products. In this review paper we are about to disclose a detailed analysis on different methodologies reported for implementation of the self-diagnosis procedures.

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